The TEM Gemini Ontology (TEMGO) provides a standardised taxonomy and vocabulary for TEM and SEM characterisation procedures, workflows, instruments and tools used within the TEM Gemini Centre.
An EMMO-based application-level ontology that defines standardised TEM and SEM characterisation procedures, workflows, instruments and tools used within the TEM Gemini Centre.
TEM Gemini Ontology (TEMGO)
TEMGO
Standard procedure for electropolishing of aluminium samples within the TEM Gemini Centre.
AluminiumElectropolishing
The standard cutting and polishing procedure within the TEM Gemini Centre for an extruded aluminium profile.
ExtrudedAluminiumCuttingAndPolishing
An atomic-resolution imaging technique that uses a specialized detector to capture high-angle, incoherent scattered electrons. This method creates images where the brightness of an atomic column is directly related to its atomic number (Z-contrast), allowing for the direct interpretation of atomic-scale chemical composition without needing complex simulations, unlike conventional bright-field imaging.
High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM)
Device used for making measurements, alone or in conjunction with one or more supplementary devices.
A specialized method to collect electron diffraction patterns in a transmission electron microscope. By scanning over the sample and for each pixel rotating a tilted incident electron beam around the central axis of the microscope, a SPED pattern is formed by integration over a collection of diffraction conditions.
An advanced imaging technique that generates high-resolution images of a sample's internal structure by scanning a focused electron beam across it and collecting transmitted signals. It provides nanoscale to atomic-level details and can acquire spectroscopic data like X-ray and electron energy loss spectra to analyze the composition of materials. STEM is similar to a conventional transmission electron microscope (TEM) in that the image is formed by electrons passing through a thin specimen, but differs in how the beam is used.
Holder for samples in a characterisation system.
A type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition.
First aging step of the T8T9 treatment.
T8T9Aging1
Second aging step of the T8T9 treatment.
T8T9Aging2
Deformation step of the T8T9 treatment.
T8T9Deformation
Thermomechanical treatment for T8 and T9 temper. Treatment steps: - 100°C @ 1h - 15% deformation - 150°C @ 2h
T8T9Treatment
The class of workflow tasks for the T8T9 treatment.
T8T9TreatmentTask
A high-resolution characterisation system that uses a beam of electrons transmitted through the sample. It provides detailed information about a sample's internal structure, morphology, and chemical composition down to the atomic level by detecting the electrons that pass through.
The date an object is received.
dateOfReceival
receivedDate
Beam dwell time on each pixel during scan.
Number of times each line was scanned for intensity integration.
Relates a property to a characterisation technique that this property is relevant for.
relatedTechnique
Reference to sample holder.
X position of the stage/specimen relative to origin
Y position of the stage/specimen relative to origin
Z position of the stage/specimen relative to origin
In-plane rotation of the SEM sample stage about the beam relative to the chamber X-axis. Positive rotation is clockwise.
Maximum in-plane rotation of the SEM sample stage about the beam relative to the chamber X-axis. Positive rotation is clockwise.
Minimum in-plane rotation of the SEM sample stage about the beam relative to the chamber X-axis. Positive rotation is clockwise.
Tilt of the stage (SEM) or specimen holder (TEM) about the X-axis. For SEM, the X-axis is defined in the chamber coordinate system (left-right). For TEM, this corresponds to ?-tilt (perpendicular to the holder's longitudinal axis). Positive tilt is clockwise.
Maximum tilt of the stage (SEM) or specimen holder (TEM) about the X-axis. For SEM, the X-axis is defined in the chamber coordinate system (left-right). For TEM, this corresponds to ?-tilt (perpendicular to the holder's longitudinal axis). Positive tilt is clockwise.
Minimum tilt of the stage (SEM) or specimen holder (TEM) about the X-axis. For SEM, the X-axis is defined in the chamber coordinate system (left-right). For TEM, this corresponds to ?-tilt (perpendicular to the holder's longitudinal axis). Positive tilt is clockwise.
Tilt of the TEM specimen holder about the ? axis (orthogonal to ? axis). Positive tilt is clockwise.
Maximum tilt of the TEM specimen holder about the ? axis (orthogonal to ? axis). Positive tilt is clockwise.
Minimum tilt of the TEM specimen holder about the ? axis (orthogonal to ? axis). Positive tilt is clockwise.
The Agent who studied the documented object.
Description about what the documented object is studied for.
Distance between the sample and the electron polepiece.